Low Refractive Index SiO<sub>2</sub> Optical Thin Films by Sputtering and Electron Beam Evaporation
نویسندگان
چکیده
منابع مشابه
Point defects in Sc2O3 thin films by ion beam sputtering.
We show that the concentration of oxygen interstitials trapped in Sc2O3 films by ion beam sputtering from metal targets can be controlled by modifying deposition conditions. We have identified point defects in the form of oxygen interstitials that are present in Sc2O3 films, in significantly high concentrations, i.e., ∼10(18) cm(-3). These results show a correlation between the increase of oxy...
متن کاملBand-Gap Tuning Of Electron Beam Evaporated Cds Thin Films
The effect of evaporation rate on structural, morphological and optical properties of electron beam evaporated CdS thin films have been investigated. CdS thin film deposited by electron beam evaporation method in 12nm/min and 60nm/min evaporation rates on glass substrates. X-ray diffraction, scanning electron microscopy, UV-Vis-NIR spectroscopy and Atomic Force Microscopy were used to character...
متن کاملVery low-refractive-index optical thin films consisting of an array of SiO2 nanorods.
The refractive-index contrast in dielectric multilayer structures, optical resonators, and photonic crystals is an important figure of merit that creates a strong demand for high-quality thin films with a low refractive index. A SiO2 nanorod layer with low refractive index of n = 1.08, to our knowledge the lowest ever reported in thin-film materials, is grown by oblique-angle electron-beam depo...
متن کاملOPTICAL AND ELECTRICAL PROPERTIES OF CdxZn8-xTe92CHALCOGENIDE THIN FILMS DEPOSITED BY THERMAL EVAPORATION AT LOW TEMPERATURE
CdxZn8-xTe92chalcogenideglass is prepared by melt quenching technique. The thin films of as-prepared glass are deposited by thermal evaporation technique under the vacuum better than 10torr. The optical parameters such as refractive index (n), extinction coefficient (k), the absorption coefficient (α), and optical band gap (Eg) are calculated from transmittance spectra in the 200-1800nm region....
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Journal of The Surface Finishing Society of Japan
سال: 2017
ISSN: 0915-1869,1884-3409
DOI: 10.4139/sfj.68.699